TC58NVG0S3AFT05 데이터 시트보기 (PDF) - Toshiba

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TC58NVG0S3AFT05

TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

Toshiba 

TC58NVG0S3AFT05

(13) Invalid blocks (bad blocks)

The device occasionally contains unusable blocks. Therefore, the following issues must be recognized:

Figure 26.

Bad Block

Bad Block

At the time of shipment, all data bytes in a valid block are FFh. For

bad blocks, all bytes are not in the FFh state. Please don’t perform erase

operation to bad blocks.

Check if the device has any bad blocks after installation into the

system. Figure 27. shows the test flow for bad block detection. Bad blocks

which are detected by the test flow must be managed as unusable blocks

by the system.

A bad block does not affect the performance of good blocks because it is

isolated from the bit line by the select gate

The number of valid blocks at the time of shipment is as follows:

MIN

TYP.

MAX

UNIT

Valid (Good) Block Number

1004



1024

Block

Bad Block Test Flow

Start

Block No = 1

Block No. = Block No. + 1

Read Check

Pass

Read Check: Read the 1st page or the 2nd

page of each block. If the column

address 0 or 2048 of the 1st

page or the 2nd page is not FF

(Hex), define the block as a bad

block.

Fail

Bad Block *1

No

Block No. = 1024

Yes

End

*1: No erase operation is allowed to detected bad blocks

Figure 27.

2003-08-20A 30/33

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