datasheetbank_Logo
전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

TC58NVG0S3AFT05 데이터 시트보기 (PDF) - Toshiba

부품명
상세내역
일치하는 목록
TC58NVG0S3AFT05 Datasheet PDF : 33 Pages
First Prev 21 22 23 24 25 26 27 28 29 30 Next Last
TC58NVG0S3AFT05
Status Read
The device automatically implements the execution and verification of the Program and Erase operations.
The Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass
/fail) of a Program or Erase operation, and determine whether the device is in Protect mode. The device status
is output via the I/O port on the RE clock after a “70h” command input.
The resulting information is outlined in Table 5.
Table 5. Status output table
STATUS
I/O1
Chip Status 1
I/O2
Not Used
I/O3
Not Used
I/O4
Not Used
I/O5
Not Used
I/O6
Ready/Busy
I/O7
Not Used
I/O8
Write Protect
Pass: 0
0 or 1
0
0
0
Ready: 1
0 or 1
Protect: 0
OUTPUT
Fail: 1
Busy: 0
The Pass/Fail status on I/O1 is only
valid when the device is in the Ready
state.
Not Protected: 1
An application example with multiple devices is shown in Figure 6.
CE1
CE2
CE3
CLE
ALE
WE
RE
I/O1
to I/O8
RY/BY
Device
1
Device
2
Device
3
CEN
Device
N
CEN + 1
Device
N+1
RY/BY
Busy
CLE
ALE
WE
CE1
CEN
RE
I/O
70h
70h
Status on Device 1
Status on Device N
Figure 6. Status Read timing application example
System Design Note: If the RY / BY pin signals from multiple devices are wired together as shown in the
diagram, the Status Read function can be used to determine the status of each individual device.
2003-08-20A 22/33

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]