[Keysight]

Introduction
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and effciency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.

Basic Features
Measurement capabilities:
Current versus voltage (IV) measurement
– Accurate and precise measurement ranges of 0.1 fA - 1 A and 0.5 µV - 200 V
– Spot and sweep measurement
– Time sampling measurements (100 µs minimum sampling rate)
– Pulsed measurement with minimum pulse widths of 50 µs using the MCSMU or 500 µs using the HPSMU, MPSMU, or HRSMU
– The ASU (atto-sense and switch unit) can be used with the MPSMU, or HRSMU to provide 0.1 fA measurement resolution and SMU/AUX path switching
– Two analog-to-digital converter choices (high-resolution ADC or high-speed ADC) available for each SMU type (HPSMU, MPSMU and HRSMU)

Capacitance measurement
– Multi-frequency AC impedance measurement supports CV (capacitance versus voltage), C-t (capacitance versus time) and C-f (capacitance versus frequency) measurement
– Capacitance measurement frequency range of 1 kHz to 5 MHz
– Quasi-Static Capacitance-Voltage (QS-CV) measurement with leakage current compensation
– Automated switching between IV and CV measurements using either the optional SCUU (SMU CMU unify unit) and GSWU (guard switch unit) or a pair of ASUs

Pulsed IV/Fast IV/Transient IV measurement
– Provides high speed and high sensitivity measurement capability for ultra-fast IV (current-voltage), pulsed IV and transient IV measurements, including NBTI/PBTI and RTN (Random Telegraph Signal Noise) measurements
– Arbitrary waveform generation with 10 ns programmable resolution
– Simultaneous high-speed voltage/current measurement (200 MSa/s, 5 ns sampling rate)
– SMU technology supports pulsed IV measurement without load line effects

Pulse Generation
– Up to ±40 V voltage pulsing and arbitrary waveform generation for non-volatile memory evaluation
– Single channel two-level and three level pulsing capability

B1500A platform:
– 15-inch touch screen supports all capabilities of the intuitive GUI for convenient device characterization
– Confgurable and upgradable measurement modules with 10 slots per mainframe
– GPIB, USB, LAN interfaces, and VGA video output port