E5551 데이터 시트보기 (PDF) - Temic Semiconductors

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E5551

Standard R/W Identification IC with Anticollision

Temic Semiconductors 

e5551

Pads

Controller

Name

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Coil1

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Coil2

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Vdd

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Vss

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Test1

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Test2

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Test3

Pad Window

136 136 mm2

136 136 mm2

78 78 mm2

78 78 mm2

78 78 mm2

78 78 mm2

78 78 mm2

Function

1st coil pad

2nd coil pad

Positive supply voltage

Negative supply voltage

(gnd)

Test pad

Test pad

Test pad

The main controller has following functions:

D Load mode register with configuration data from

EEPROM block 0 after power-on and also during

reading

D Control memory access (read, write)

D Handle write data transmission and the write error

modes

D The first two bits of the write data stream are the OP-

code. There are two valid OP-codes (standard and

stop) which are decoded by the controller.

Coil 2 1

8 Coil 1

D In password mode, the 32 bits received after the OP-

code are compared with the stored password in

block 7.

2

7

e5551

3

6

Bitrate Generator

The bitrate generator can deliver the following bitrates:

RF/8 - RF/16 - RF/32 - RF/40 - RF/50 - RF/64 - RF/100 - RF/128

Write Decoder

4

5

Decode the detected gaps during writing. Check if write

data stream is valid.

Note:

Pins 2 to 7 have to be open. They are

not specified for applications

Figure 2. Pinning SO8

e5551 Building Blocks

Analog Front End (AFE)

The AFE includes all circuits which are directly

connected to the coil. It generates the IC’s power supply

and handles the bidirectional data communication with

the reader unit. It consists of the following blocks:

D Rectifier to generate a dc supply voltage from the ac

coil voltage

Test Logic

Test circuitry allows rapid programming and verification

of the IC during test.

HV Generator

Voltage pump which generates [18 V for programming

of the EEPROM.

Pad Layout

Coil 1

e5551

D Clock extractor

Coil 2

D Switchable load between Coil1/ Coil2 for data trans-

mission from the IC to the reader unit (read)

V DD V SS

Test pads

D Field gap detector for data transmission from the

reader unit into the IC (write)

Figure 3. Pad layout

2 (21)

Rev. A2, 19-Apr-00

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