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HEF4071BP 데이터 시트보기 (PDF) - NXP Semiconductors.

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HEF4071BP
NXP
NXP Semiconductors. NXP
HEF4071BP Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
NXP Semiconductors
HEF4071B
Quad 2-input OR gate
13. Abbreviations
Table 11. Abbreviations
Acronym
Description
DUT
Device Under Test
ESD
ElectroStatic Discharge
HBM
Human Body Model
MM
Machine Model
14. Revision history
Table 12. Revision history
Document ID
Release date Data sheet status
Change notice Supersedes
HEF4071B_4
Modifications:
20081128
Product data sheet
-
HEF4071B_CNV_3
The format of this data sheet has been redesigned to comply with the new identity
guidelines of NXP Semiconductors.
Legal texts have been adapted to the new company name where appropriate.
Temperature range maximum increased from 85 °C to 125 °C throughout the data sheet.
Section 1 “General description” voltage and temperature range statement added.
Section 2 “Features” added.
Package SOT73 removed from Section 3 “Ordering information” and Section 12 “Package
outline”.
Section 5.2 “Pin description” added.
Section 6 “Functional description”, Section 7 “Limiting values”, Section 8 “Recommended
operating conditions” and Section 9 “Static characteristics” added, taken from the HE4000B
Family Specifications data sheet.
Section 9 “Static characteristics” IOH, IOL, II and IDD values updated.
Section 10 “Dynamic characteristics” tTHL and tTLH combined in tt.
Section 13 “Abbreviations” added.
HEF4071B_CNV_3
19950101
Product specification
-
HEF4071B_CNV_2
HEF4071B_CNV_2
19950101
Product specification
-
-
HEF4071B_4
Product data sheet
Rev. 04 — 28 November 2008
© NXP B.V. 2008. All rights reserved.
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