HEF4071BP 데이터 시트보기 (PDF) - NXP Semiconductors.

부품명

상세내역

일치하는 목록

HEF4071BP

Quad 2-input OR gate

NXP Semiconductors. 

NXP Semiconductors

HEF4071B

Quad 2-input OR gate

Table 9. Measurement points

Supply voltage

VDD

5 V to 15 V

Input

VM

0.5VDD

Output

VM

0.5VDD

VDD

VI

G

VO

DUT

RT

CL

001aag182

Fig 5.

Test data is given in Table 10.

Definitions for test circuit:

DUT = Device Under Test.

CL = load capacitance including jig and probe capacitance.

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

Test circuit

Table 10. Test data

Supply voltage

VDD

5 V to 15 V

Input

VI

VSS or VDD

tr, tf

≤ 20 ns

Load

CL

50 pF

HEF4071B_4

Product data sheet

Rev. 04 — 28 November 2008

© NXP B.V. 2008. All rights reserved.

6 of 11

Share Link: