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ISPLSI2032A-80LT44I 데이터 시트보기 (PDF) - Lattice Semiconductor

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ISPLSI2032A-80LT44I
Lattice
Lattice Semiconductor Lattice
ISPLSI2032A-80LT44I Datasheet PDF : 15 Pages
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Specifications ispLSI 2032/A
Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Figure 2. Test Load
Input Rise and Fall Time
-135, -150, -180 1.5 ns
+ 5V
10% to 90%
-80, -110
3 ns
Input Timing Reference Levels
1.5V
R1
Output Timing Reference Levels
Output Load
3-state levels are measured 0.5V from
steady-state active level.
1.5V
See Figure 2
Table 2-0003/2032
Output Load Conditions (see Figure 2)
TEST CONDITION
A
Active High
R1
470
R2
390
390
CL
35pF
35pF
Device
S Output
Test
Point
R2
CL*
IGN *CL includes Test Fixture and Probe Capacitance.
DES 0213A
B
Active Low
Active High to Z
C
at VOH -0.5V
Active Low to Z
at VOL+0.5V
470390
390
35pF
5pF
470
3905pF
Table 2 - 0004A
NEW
R DC Electrical Characteristics
FO Over Recommended Operating Conditions
SYMBOL
PARAMETER
CONDITION
E VOL
Output Low Voltage
IOL= 8 mA
2 VOH
3 IIL
0 IIH
2 IIL-isp
I IIL-PU
S IOS1
ispL ICC2, 4
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
IOH = -4 mA
0V VIN VIL (Max.)
3.5V VIN VCC
0V VIN VIL
0V VIN VIL
VCC= 5V, VOUT = 0.5V
VIL= 0.0V, VIH= 3.0V
fTOGGLE = 1 MHz
Comm. -180, -150
Others
Industrial
MIN.
2.4
TYP.3
60
40
40
MAX. UNITS
0.4
V
V
-10 µA
10
µA
-150 µA
-150 µA
-200 mA
mA
mA
mA
Table 2-0007/2032
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test problems
E by tester ground degradation. Characterized but not 100% tested.
S 2. Measured using two 16-bit counters.
3. Typical values are at VCC= 5V and TA= 25°C.
U 4. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum ICC.
4

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