HEF4511B 데이터 시트보기 (PDF) - NXP Semiconductors.

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HEF4511B

BCD to 7-segment latch/decoder/driver

NXP Semiconductors. 

NXP Semiconductors

HEF4511B

BCD to 7-segment latch/decoder/driver

7. Limiting values

Table 4. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).

Symbol Parameter

Conditions

VDD

IIK

VI

IOK

II/O

IOH

IDD

Tstg

Tamb

Ptot

supply voltage

input clamping current

input voltage

output clamping current

input/output current

HIGH-level output current

supply current

storage temperature

ambient temperature

total power dissipation

VI < 0.5 V or VI > VDD + 0.5 V

VO < 0.5 V or VO > VDD + 0.5 V

Tamb = 125 C

DIP16 package

SO16 package

P

power dissipation

per output

Min

0.5

-

0.5

-

-

[1] 25

-

65

40

[2] -

[3] -

-

Max

Unit

+18

V

10

mA

VDD + 0.5 V

10

mA

10

mA

-

mA

50

mA

+150

C

+125

C

750

mW

500

mW

100

mW

[1] A destructive high current mode may occur if VI and VO are not constrained to the range VSS  VI or VO  VDD.

[2] For DIP16 package: Ptot derates linearly with 12 mW/K above 70 C.

[3] For SO16 package: Ptot derates linearly with 8 mW/K above 70 C.

8. Recommended operating conditions

Table 5.

Symbol

VDD

VI

Tamb

t/V

Recommended operating conditions

Parameter

Conditions

supply voltage

input voltage

ambient temperature

in free air

input transition rise and fall rate

VDD = 5 V

VDD = 10 V

VDD = 15 V

Min Typ Max

Unit

3

-

15

V

0

-

40 -

VDD

V

+125 C

-

-

3.75

s/V

-

-

0.5

s/V

-

-

0.08

s/V

HEF4511B

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 7 — 11 November 2011

© NXP B.V. 2011. All rights reserved.

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