ADP3808AJPZ 데이터 시트보기 (PDF) - ON Semiconductor
부품명
상세내역
일치하는 목록
ADP3808AJPZ Datasheet PDF : 15 Pages
| |||
ADP3808A
ABSOLUTE MAXIMUM RATINGS
Description
Symbol
Value
Unit
Supply Voltage Input
VCC
−0.3 to +25
V
Power Ground
PGND
−0.3 to +0.3
V
Bootstrap Supply Voltage Input
BST
−0.3 to +30
V
BST to Switching Node
BST to SW
−0.3 to +6
V
Switching Node
SW
−4 to +25
V
High−Side Driver Output
DRVH
SW − 0.3 to BST + 0.3
V
Low−Side Driver Output
DRVL
PGND − 0.3 to DRVREG + 0.3
V
System Sense Inputs to Analog Ground
SYSP, SYSM to AGND
V
DC
−25 to +30
< 50 msec
−25 to +35
Battery Input, Current Sense Inputs to Analog
BAT, CSP, CSM to AGND
−0.3 to VCC + 0.3
V
Ground
Positive System Sense Input to Negative System
Sense Input
SYSP to SYSM
−5 to +5
V
Positive Current Sense Input to Negative Current
Sense Input
CSP to CSM
−5 to +5
V
All Other Inputs and Outputs
DRVREG, CSADJ, EN,
−0.3 to +6
V
CELLSEL, REFIN, BATADJ,
LIMSET, LIMIT, ISYS, EXTPWR
2-Layer Board
4-Layer Board
qJA
125
°C/W
83
Operating Ambient Temperature Range
TA
0 to 100
°C
Junction Temperature Range
TJ
0 to 150
°C
Storage Temperature Range
TS
Lead Temperature
Soldering (10 sec)
Vapor Phase (60 sec)
Infrared (15 sec)
−65 to +150
°C
300
°C
215
220
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
NOTE: This device is ESD sensitive. Use standard ESD precautions when handling.
http://onsemi.com
3
Share Link: 