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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

XC9119D10A 데이터 시트보기 (PDF) - TOREX SEMICONDUCTOR

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XC9119D10A Datasheet PDF : 18 Pages
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XC9119D10A Series
TEST CIRCUITS
Circuit
CIN
VIN
4.7uF
(ceramic)
VCE
L:22uH
SD
CDRH4D18C XB01SB04A2BR
VOUT
VDD
CE/SS
VSS
Lx CFB
1000pF
(ceramic)
FB
V
RFB1
300kΩ
CL
4.7uF
(ceramic)
RFB2
75kΩ
V
RL
Circuit
OSC
A
VIN
Rpull
Lx
CE
FB
220uF
VIN
VSS
1uF
VCE
VFB
Circuit
VIN
Vpull
A
VIN
Lx
A CE
FB A
VSS
1uF
VCE
VFB
A
VLx
Circuit
OSC
10 Ω 300Ω
100uF/16V
(OS capacitor)
10V
VIN
Lx
R2
CE
FB
4.3kΩ
Vpull
VIN
4.7uF/10V
VSS
(ceramic)
VCE
2SK583
R1
1.1kΩ
V
0.01uF
(ceramic)
47uF/25V
(OS capacitor)
1. The measurement method of Lx On resistance RSWON
Using the circuit , Lx On resistance can be measured by adjusting Vpull voltage to set Lx voltage VLx x 0.4V when the
driver transistor is ON. The oscilloscope is used for measuring the Lx voltage when the driver transistor is ON.
RSWON = 0.4 / {(Vpull – 0.4) / 10}
2. The measurement method of current limit ILIM
Using the circuit , current limit ILIM can be calculate by the equation including Vpull voltage when FB voltage is
decreased while Vpull voltage is adjusted and Lx voltage VLx when the driver transistor is ON. The oscilloscope is used
for measuring the Lx voltage when the driver transistor is ON.
ILIM=(Vpull – VLx) / Rpull
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