CY7C4265-10ASC(2004) 데이터 시트보기 (PDF) - Cypress Semiconductor
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CY7C4265-10ASC Datasheet PDF : 22 Pages
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CY7C4255
CY7C4265
Maximum Ratings [1]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................ –65°C to +150°C
Ambient Temperature with Power Applied . –55°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... –0.5V to +7.0V
DC Input Voltage ..........................................−0.5V to VCC+0.5V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage............................................ >2001V
(per MIL–STD–883, Method 3015)
Latch-Up Current..................................................... >200 mA
Operating Range[2]
Range
Commercial
Industrial[3]
Ambient
Temperature
0°C to +70°C
–40°C to +85°C
VCC
5V ± 10%
5V ± 10%
Electrical Characteristics Over the Operating Range[3]
Parameter
VOH
VOL
VIH[4]
VIL[5]
IIX
IOZL
IOZH
ICC1[6]
ICC2[7]
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage
Current
Output OFF,
High Z Current
Active Power Supply
Current
Average Standby
Current
Test Conditions
VCC = Min.,
IOH = –2.0 mA
VCC = Min.,
IOL = 8.0 mA
VCC = Max.
OE > VIH,
VSS < VO < VCC
Com’l
Ind
Com’l
Ind
7C42X5–10 7C42X5–15 7C42X5–25 7C42X5– 35
Min. Max. Min. Max. Min. Max. Min. Max. Unit
2.4
2.4
2.4
2.4
V
0.4
0.4
0.4
0.4 V
2.0 VCC 2.0 VCC 2.0 VCC 2.0 VCC V
–0.5 0.8 –0.5 0.8 –0.5 0.8 –0.5 0.8 V
–10 +10 –10 +10 –10 +10 –10 +10 µA
–10 +10 –10 +10 –10 +10 –10 +10 µA
45
45
45
45 mA
50
50
50
50 mA
10
10
10
10 mA
15
15
15
15 mA
Capacitance[8, 9]
Parameter
CIN
COUT
Description
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Max.
Unit
5
pF
7
pF
Notes:
1. The Voltage on any input or I/O pin cannot exceed the power pin during power-up.
2. TA is the “Instant On” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. The VIH and VIL specifications apply for all inputs except WXI, RXI. The WXI, RXI pin is not a TTL input. It is connected to either RXO, WXO of the
previous device or VSS.
5. The VIH and VIL specifications apply for all inputs except WXI, RXI. The WXI, RXI pin is not a TTL input. It is connected to either RXO, WXO of the
previous device or VSS.
6. Input signals switch from 0V to 3V with a rise/fall time of less than 3 ns, clocks and clock enables switch at 20 MHz, while data inputs switch at 10 MHz. Outputs
are unloaded. ICC1(typical) = (25 mA+(freq –20 MHz)*(1.0 mA/MHz)).
7. All inputs = VCC – 0.2V, except RCLK and WCLK (which are switching at frequency = 20 MHz), and FL/RT which is at Vss. All outputs are unloaded.
8. Tested initially and after any design changes that may affect these parameters.
9. Tested initially and after any process changes that may affect these parameters.
Document #: 38-06004 Rev. *B
Page 4 of 22
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