CY7C4225-10AXI 데이터 시트보기 (PDF) - Cypress Semiconductor
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CY7C4225-10AXI Datasheet PDF : 25 Pages
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CY7C4205/CY7C4215
CY7C4225/CY7C4245
Maximum Ratings[6]
(Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested)
Storage temperature 65 C to +150 C
Ambient temperature with
power applied 55 C to +125 C
Supply voltage to ground potential 0.5 V to +7.0 V
DC voltage applied to outputs
in High-Z state 0.5 V to +7.0 V
DC input voltage 3.0 V to +7.0 V
Output current into outputs (LOW) .............................. 20 mA
Static discharge voltage ........................................... >2001 V
(per MIL-STD-883, Method 3015)
Latch-up current ...................................................... >200mA
Operating Range
Range
Commercial
Industrial[4]
Ambient Temperature
0 C to +70C
-40C to +85C
VCC
5 V ± 10%
5 V ± 10%
Electrical Characteristics Over the Operating Range[6]
-10
-15
Parameter
Description
Test Conditions
Min
Max
Min
Max
Unit
VOH
VOL
VIH[7]
VIL[7]
IIX
IOS [8]
Output HIGH voltage
Output LOW voltage
Input HIGH voltage
Input LOW voltage
Input leakage current
Output short circuit current
VCC = Min
IOH = 2.0 mA
VCC = Min
IOL = 8.0 mA
VCC = Max
VCC = Max
VOUT = GND
2.4
2.4
V
0.4
0.4
V
2.2
VCC
2.2
VCC
V
3.0
0.8
3.0
0.8
V
10
+10
10
+10
A
90
90
A
IOZL
IOZH
ICC[9]
ISB[10]
Output OFF,
High Z current
Operating current
Standby current
OE > VIH,
VSS < VO < VCC
VCC = Max
IOUT = 0 mA
VCC = Max
IOUT = 0 mA
Com’l
Ind’l
Com’l
Ind’l
10
+10
10
+10
A
45
45
mA
50
50
mA
10
10
mA
15
15
mA
Capacitance[11]
Parameter
Description
Test Conditions
Max
CIN
Input capacitance
TA = 25 C, f = 1 MHz,
5
COUT
Output capacitance
VCC = 5.0 V
7
Unit
pF
pF
Notes
4. TA is the “instant on” case temperature.
5. See the last page of this specification for Group A subgroup testing information.
6. The Voltage on any input or I/O pin cannot exceed the power pin during power-up
7. TorheVSVSIH. and VIL specifications apply for all inputs except WXI, RXI. The WXI, RXI pin is not a TTL input. It is connected to either RXO, WXO of the previous device
8. Test no more than one output at a time for not more than one second.
9. Input signals switch from 0 V to 3 V with a rise/fall time less than 3 ns, clocks and clock enables switch at 20 MHz, while the data inputs switch at 10 MHz. Outputs
are unloaded.
10. All input signals are connected to VCC. All outputs are unloaded.
11. Tested initially and after any design or process changes that may affect these parameters.
Document Number: 001-45652 Rev. *B
Page 10 of 25
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