74F598 데이터 시트보기 (PDF) - Philips Electronics
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74F598 Datasheet PDF : 14 Pages
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Philips Semiconductors
8-bit shift register with input storage registers (3-State)
Product specification
74F598
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
VOH
High-level output voltage
Qs VCC = MIN, IOH = –1mA ±10%VCC 2.5
V
VIL = MAX,
VIL = MAX,
±5%VCC 2.7 3.4
V
I/On VIH = MIN, IOH = –3mA ±10%VCC 2.4
V
VIL = MAX,
±5%VCC 2.7 3.3
V
VOL
Low-level output voltage
VIK
Input clamp voltage
II
Input current at maximum input voltage
IIH
IIL
IOZH + IIH
High–level input current
Low–level input current
Off–state output current,
High–level voltage applied
others
I/On
VCC = MIN, VIL = MAX,
VIH = MIN, IOL = MAX
VCC = MIN, II = IIK
VCC = MAX, VI = 7.0V
VCC = MAX, VI = 5.5V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
I/On VCC = MAX, VO = 2.7V
±10%VCC
±5%VCC
0.30 0.50 V
0.30 0.50 V
–0.73 -1.2 V
100 µA
1 mA
20 µA
–20 µA
70 µA
IOZL + IIL
IOS
Off–state output current,
Low–level voltage applied
Short–circuit output current3
only VCC = MAX, VO = 0.5V
VCC = MAX
–70 µA
-60
-150 mA
ICCH
68 100 mA
ICC
Supply current (total)
ICCL VCC = MAX
80 110 mA
ICCZ
73 105 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of High-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1991 Oct 21
6
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