Detailed description
The sensor consists of 128 photodiodes arranged in a linear array. Light energy falling on a photodiode generates photocurrent, which is integrated by the active integration circuitry associated with that pixel. During the integration period, a sampling capacitor connects to the output of the integrator through an analog switch. The amount of charge accumulated at each pixel is directly proportional to the light intensity and the integration time. The output and reset of the integrators is controlled by a 132-bit shift register and reset logic. An output cycle is initiated by clocking in a logic 1 on SI. This causes all 132 sampling capacitors to be disconnected from their respective integrators and starts an integrator reset period. As the SI pulse is clocked through the shift register, the charge stored on the sampling capacitors is sequentially connected to a charge-coupled output amplifier that generates a voltage on analog output AO. Two dummy pixel values are shifted out first, then the 128 actual pixel bits, followed by two additional dummy pixel bits, for a total of 132 data bits.

FEATURES
• 128 x 1 Sensor-Element Organization (1 Not Connected, 1 dummy, 128 real, 1 dummy and 1 Dark Pixel)
• 385 Dots-Per-Inch (DPI) Sensor Pitch
• High Linearity and Uniformity for 256 Gray-Scale (8-Bit) Applications
• Optimization: less Gain in order to get better Signal To Noise behavior: up to 13 bits
• Output becomes high impedance after CLK 132
• Extremely low integration times possible: up to 10 µs! (independent of clock speed)
• Output Referenced to Ground
• Low Image Lag ... 0.5% Typ
• Single 5-V Supply
• Replacement of Texas Instruments TSL1301 & TSL1401
• Operation to 1MHz