Description
The Atmel® AT30TSE004A is a combination Serial EEPROM and temperature sensor device containing 4096- bits of Serially Electrically Erasable and Programmable Read-Only Memory (EEPROM) organized as 512-bytes of eight bits each. The Serial EEPROM operation is tailored specifically for DRAM memory modules with Serial Presence Detect (SPD) to store a module’s vital product data such as the module’s size, speed, voltage, data width, and timing parameters.

FEATUREs
● Integrated Temperature Sensor (TS) + 4-Kbit Serial EEPROM
● JEDEC JC42.4 (TSE2004av) DIMM Serial Presence Detect (SPD) + TS
   compliant
● Low voltage operation
   ̶ Optimized for VCC range of 1.7V to 3.6V
● 2-wire serial interface: I2C Fast Mode Plus (FM+) compatible
   ̶ 100kHz, 400kHz, and 1MHz compatibility
   ̶ Bus Timeout supported
● Schmitt Trigger, filtered inputs for noise suppression
● Industry standard green (Pb/Halide-free/RoHS compliant) package options
   ̶ 8-pad Ultra Thin DFN (2 x 3 x 0.6mm)
   ̶ 8-pad Very Very Thin DFN (2 x 3 x 0.8mm)

Temperature Sensor Features
● Highly accurate B-grade temp. measurements requiring no external
   components
   ̶ ±1.0°C accuracy (maximum) over the +75°C to +95°C range
   ̶ ±2.0°C accuracy (maximum) over the +40°C to +125°C range
   ̶ ±3.0°C accuracy (maximum) over the -20°C to +125°C range
● 11-bit ADC temperature-to-digital converter with 0.125°C resolution
● Programmable hysteresis threshold: off, 0°C, 1.5°C, 3°C, and 6°C
● Low operating current
   ̶ Temperature sensor active ~0.2mA (typical)

Serial EEPROM Features
● Integrates 4-Kbits of Serial EEPROM
   ̶ Internally organized into four quadrants of 128-bytes each
● Individual Reversible Software Write Protection on all four 128-byte quadrants
● Supports byte and Page Write operations
● Self-timed write cycle (5ms maximum)
● High-reliability
   ̶ Endurance: 1,000,000 write cycles
   ̶ Data retention: 100 years
● Low operating current
   ̶ Serial EEPROM Write ~1.5mA (typical)
   ̶ Serial EEPROM Read ~0.2mA (typical)