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LX8586A-33(2005) 데이터 시트보기 (PDF) - Microsemi Corporation

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LX8586A-33
(Rev.:2005)
Microsemi
Microsemi Corporation Microsemi
LX8586A-33 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
LX8586 / LX8586A
TM
®
6A Low Dropout Positive Regulators
PRODUCTION DATA SHEET
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, the following specifications apply over the operating ambient temperature 0°C TA 70°C; VIN – VOUT =
3V, IOUT = 6A. Low duty cycle pulse testing techniques are used which maintains junction and case temperatures equal to the ambient
temperature.
Parameter
Symbol
` LX8586-00 / LX8586A-00 (ADJUSTABLE)
Test Conditions
LX8586/86A-00
Units
Min Typ Max
Reference Voltage
VREF
IOUT = 10mA, TA = 25°C
10mA < IOUT < 6A, 1.5V < (VIN – VOUT),
VIN < 7V, P < PMAX
Line Regulation (Note 2)
VREF(VIN) IOUT = 10mA, 1.5V < (VIN – VOUT), VIN < 7V
Load Regulation (Note 2)
VREF(IOUT) VIN – VOUT = 3V, 10mA < IOUT < 6A
Thermal Regulation
VOUT(Pwr) TA = 25°C, 20ms pulse
Ripple Rejection (Note 3)
VOUT = 3.3V, f = 120Hz, COUT = 100µF Tantalum,
VIN = 5V, CADJ = 10µF, TA = 25°C, IOUT = 6A
Adjust Pin Current
IADJ
Adjust Pin Current Change
IADJ
10mA < IOUT < 6A, 1.5V < (VIN – VOUT), VIN < 7V
Dropout Voltage LX8586-00
LX8586A-00
V
VREF = 1%, IOUT = 6A
VREF = 1%, IOUT = 6A
Minimum Load Current
IOUT(MIN)
VIN < 7V
Maximum Output Current
IOUT(MAX) 1.4V < (VIN – VOUT), VIN < 7V
Temperature Stability
VOUT(T)
Long Term Stability
VOUT(t) TA = 125°C, 1000hrs
RMS Output Noise (% of VOUT)
VOUT(RMS) TA = 25°C, 10Hz < f < 10kHz
` LX8586-33 / LX8586A-33 (3.3V FIXED)
1.238
1.225
60
6.1
1.250
1.250
0.035
0.1
0.01
83
55
0.2
1.1
0.9
2
8
0.25
0.3
0.003
1.262
1.275
0.20
0.5
0.02
100
5
1.3
1.1
10
V
%
%
% /W
dB
µA
µA
V
mA
A
%
%
%
Output Voltage
Line Regulation (Note 2)
Load Regulation (Note 2)
Thermal Regulation (Note 3)
Ripple Rejection (Note 3)
Quiescent Current
Dropout Voltage LX8586-33
LX8586A-33
Maximum Output Current
Temperature Stability (Note 3)
Long Term Stability (Note 3)
RMS Output Noise (% of VOUT)
(Note 3)
VOUT
VOUT(VIN)
VOUT(IOUT)
VOUT(Pwr)
IQ
V
IOUT(MAX)
VOUT (T)
VOUT (t)
VIN = 5V, IOUT = 0mA, TA = 25°C
4.75V < VIN < 10V, 0mA < IOUT < 6A, P < PMAX
4.75V < VIN < 7V
4.75V < VIN < 10V
VIN = 5V, 10mA < IOUT < IOUT(MAX)
TA = 25°C, 20ms pulse
COUT = 100µF Tantalum, IOUT = 6A, TA = 25°C
0mA < IOUT < IOUT(MAX), 4.75 < VIN < 10V
VOUT = 1%, IOUT < IOUT(MAX)
VOUT = 1%, IOUT < IOUT(MAX)
VIN < 7A
TA = 25°C, 1000 hrs
VOUT(RMS) TA = 25°C, 10Hz < f < 10kHz
3.267
3.235
65
6.1
3.3
3.3
1
2
5
0.01
83
4
1.1
0.9
8
0.25
0.3
0.003
3.333
3.365
6
10
15
0.02
10
1.3
1.1
1
V
mV
mV
% /W
dB
mA
V
A
%
%
%
Note 2: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output voltage due to heating
effects are covered under the specification for thermal regulation.
Note 3: These parameters, although guaranteed, are not tested in production.
Copyright © 1996
Rev. 1.0a, 2005-11-10
Microsemi
Integrated Products Division
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 3

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