IDT74FCT543DTSOG 데이터 시트보기 (PDF) - Integrated Device Technology
부품명
상세내역
일치하는 목록
IDT74FCT543DTSOG Datasheet PDF : 7 Pages
| |||
IDT74FCT543AT/CT/DT
FAST CMOS OCTAL LATCHED TRANSCEIVER
FUNCTION TABLE(1, 2)
For A-to-B (Symmetric with B-to-A)
CEAB
Inputs
LEAB OEAB
Latch
Status
A-to-B
Output
Buffers
B0–B7
H
X
X
Storing
High Z
X
H
X
Storing
X
X
X
H
X
High Z
L
L
L
Transparent
Current A Inputs
L
H
L
Storing
Previous* A Inputs
NOTES:
1. * Before LEAB LOW-to-HIGH Transition
H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
2. A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA
and OEBA.
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
Symbol
Parameter
Test Conditions(1)
Min. Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
IIH
Input HIGH Current(4)
IIL
Input LOW Current(4)
VCC = Max.
VCC = Max.
VI = 2.7V
VI = 0.5V
IOZH
High Impedance Output Current VCC = Max
VO = 2.7V
IOZL
(3-State output pins)(4)
VO = 0.5V
II
Input HIGH Current(4)
VCC = Max., VI = VCC (Max.)
VIK
Clamp Diode Voltage
VCC = Min, IIN = -18mA
VH
Input Hysteresis
—
ICC
Quiescent Power Supply Current VCC = Max., VIN = GND or VCC
—
—
0.8
V
—
—
±1
µA
—
—
±1
µA
—
—
±1
µA
—
—
±1
—
—
±1
µA
—
–0.7
–1.2
V
—
200
—
mV
—
0.01
1
mA
OUTPUT DRIVE CHARACTERISTICS
Symbol
Parameter
Test Conditions(1)
VOH
Output HIGH Voltage
VCC = Min
IOH = –8mA
VIN = VIH or VIL
IOH = –15mA
VOL
Output LOW Voltage
VCC = Min
IOS
Short Circuit Current
VIN = VIH or VIL
VCC = Max., VO = GND(3)
IOFF
Input/Output Power Off Leakage(5) VCC = 0V, VIN or VO ≤ 4.5V
IOL = 64mA
Min. Typ.(2)
Max.
Unit
2.4
3.3
—
V
2
3
—
—
0.3
0.55
V
–60
–120
–225
mA
—
—
±1
µA
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = –55°C.
5. This parameter is guaranteed but not tested.
3
Share Link: 