M95640, M95320
Figure 15. AC Measurement I/O Waveform
Input Levels
0.8VCC
0.2VCC
Input and Output
Timing Reference Levels
0.7VCC
0.3VCC
AI00825B
Table 15. Capacitance
Symbol
Parameter
Test Condition
COUT
Output Capacitance (Q)
VOUT = 0V
CIN
Input Capacitance (D)
VIN = 0V
Input Capacitance (other pins)
VIN = 0V
Note: Sampled only, not 100% tested, at TA=25°C and a frequency of 5MHz.
Min.
Max.
Unit
8
pF
8
pF
6
pF
Table 16. DC Characteristics (M95320 and M95640, Device Grade 6)
Symbol
Parameter
Test Condition
Min.
Max.
ILI
Input Leakage Current
VIN = VSS or VCC
±2
ILO
Output Leakage Current
S = VCC, VOUT = VSS or VCC
±2
C = 0.1VCC/0.9VCC at 5MHz,
VCC = 5V, Q = open,
4
Previous Product2
ICC
Supply Current
C = 0.1VCC/0.9VCC at 10MHz,
VCC = 5V, Q = open, Current Product3
5
C = 0.1VCC/0.9VCC at 20MHz,
VCC = 5V, Q = open, New Product 4,5
10
S = VCC, VCC = 5V,
VIN = VSS or VCC, Previous Product 2
10
ICC1
Supply Current
(Standby)
S = VCC , VCC = 5V,
VIN = VSS or VCC, Current Product 3
2
S = VCC, VCC = 5V,
VIN = VSS or VCC, New Product 4,5
2
VIL
Input Low Voltage
–0.45
0.3 VCC
VIH Input High Voltage
0.7 VCC
VCC+1
VOL1 Output Low Voltage
IOL = 2 mA, VCC = 5V
0.4
VOH1 Output High Voltage
IOH = –2 mA, VCC = 5V
0.8 VCC
Note: 1. For all 5V range devices, the device meets the output requirements for both TTL and CMOS standards.
2. Previous product version is identified by Process Identification letter ‘S’.
3. Current product version is identified by Process Identification letter ‘V’’.
4. New product version is identified by Process Identification letter ‘P’.
5. Preliminary data.
Unit
µA
µA
mA
mA
mA
µA
µA
µA
V
V
V
V
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