74ABT20 데이터 시트보기 (PDF) - NXP Semiconductors.
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74ABT20 Datasheet PDF : 13 Pages
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Nexperia
74ABT20
Dual 4-input NAND gate
8. Recommended operating conditions
Table 5. Operating conditions
Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
VCC
VI
VIH
VIL
IOH
IOL
t/V
supply voltage
input voltage
HIGH-level input voltage
LOW-level input voltage
HIGH-level output current
LOW-level output current
input transition rise and fall rate
Tamb
ambient temperature
9. Static characteristics
Conditions
in free air
Min
Typ
Max Unit
4.5
-
5.5 V
0
-
VCC V
2.0
-
-
V
-
-
0.8 V
15
-
-
mA
-
-
20 mA
0
-
5 ns/V
40
-
+85 C
Table 6. Static characteristics
Symbol Parameter
Conditions
VIK
VOH
VOL
II
IOFF
ICEX
IO
ICC
ICC
CI
input clamping voltage VCC = 4.5 V; IIK = 18 mA
HIGH-level output
voltage
VCC = 4.5 V; IOH = 15 mA;
VI = VIL or VIH
LOW-level output
voltage
VCC = 4.5 V; IOL = 20 mA;
VI = VIL or VIH
input leakage current VCC = 5.5 V; VI = GND or 5.5 V
power-off leakage
current
VCC = 0 V; VI or VO 4.5 V
output high leakage
current
output current
supply current
additional supply
current
input capacitance
HIGH-state; VO = 5.5 V;
VCC = 5.5 V; VI = GND or VCC
VCC = 5.5 V; VO = 2.5 V
VCC = 5.5 V; VI = GND or VCC
per input pin; VCC = 5.5 V;
one input at 3.4 V;
other inputs at VCC or GND
VI = 0 V or VCC
25 C
40 C to +85 C Unit
Min Typ Max Min Max
1.2 0.9 - 1.2
-V
2.5 2.9 -
2.5
-V
- 0.35 0.5
-
0.5 V
- 0.01 1.0 -
- 5.0 100 -
1.0 A
100 A
- 5.0 50
-
50 A
[1] 50 75 180 50
-
2 50
-
[2] - 0.25 500
-
180 mA
50 A
500 A
-
3
-
-
- pF
[1] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
[2] This is the increase in supply current for each input at 3.4 V.
74ABT20
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 12 August 2016
© Nexperia B.V. 2017. All rights reserved
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