SGA-8343X 데이터 시트보기 (PDF) - Stanford Microdevices

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SGA-8343X

Reliability Qualification Report

Stanford Microdevices 

SGA-8343X Reliability Qualification Report

Group J

Test Conditions

Tin Whiskering Biased

Temperature 51°C/85% humidity. Test Duration 1000 hours.

Number of

Devices Under

Test

Group K

Test Conditions

15

Test

SMDI Internal

Results PASS

Standard

Tin Whiskering Unbiased

Temperature 51°C/85% humidity. Test Duration 1000 hours.

Number of

15

Devices Under

Test

Test

Standard

SMDI Internal

Results PASS

(1)

1 device removed for improper assembly. See CAR number 350; Reference FA04032.

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