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33742

System Basis Chip with Enhanced High Speed CAN Transceiver

Freescale Semiconductor 

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 4. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Rating

Symbol

Value

Unit

ELECTRICAL RATINGS

Power Supply Voltage at VSUP

Continuous (Steady-state)

Transient Voltage (Load Dump)

VSUP

V

- 0.3 to 27

- 0.3 to 40

Logic Signals

(RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and INT)

VLOG

- 0.3 to VDD + 0.3

V

Output Voltage at VDD

VDD

0.0 to 5.3

V

Output Current at VDD

IDD

Internally Limited

A

HS

Voltage

Output Current

ESD Capability, Human Body Model(1)

MC33742 in 28-pin SOIC

HS, L0, L1, L2, L3, CANH, CANL pins

All Other pins

MC33742 in 48-pin QFN

All pins

VHS

IHS

VESD1

- 0.3 to VSUP + 0.3

V

Internally Limited

A

V

± 4000

± 2000

± 2000

ESD Capability, Machine Model(1)

VESD2

± 200

V

Input Voltage/Current at L0, L1, L2, L3

DC Input Voltage

DC Input Current

Transient Input Voltage attached to external circuitry(2)

VDCIN

IDCIN

VTRINEC

- 0.3 to 40

V

± 2.0

mA

± 100

V

CANL and CANH

Continuous Voltage

Continuous Current

VCANH/L

ICANH/L

- 27 to 40

V

200

mA

CANH and CANL Transient Voltage (Load Dump)(3)

CANH and CANL Transient Voltage(3)

VLDH/L

VTRH/L

40

V

± 40

V

Notes

1. Testing done in accordance with the Human Body Model (CZAP=100pF, RZAP=1500Ω), Machine Model (CZAP=200pF, RZAP=0Ω).

2. Testing done in accordance with ISO 7637-1. See Figure 5.

3. Load dump testing done in accordance with ISO 7637-1, Transient test done in accordance with ISO 7637-1. See Figure 6.

Analog Integrated Circuit Device Data

Freescale Semiconductor

33742

7

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