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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

TGA4505 데이터 시트보기 (PDF) - TriQuint Semiconductor

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TGA4505
TriQuint
TriQuint Semiconductor TriQuint
TGA4505 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
TGA4505
TABLE I
MAXIMUM RATINGS
Symbol
V+
V-
I+
| IG |
PIN
PD
TCH
TSTG
Parameter 1/
Positive Supply Voltage
Negative Supply Voltage Range
Positive Supply Current:
Gate Supply Current
Input Continuous Wave Power
Power Dissipation
Operating Channel Temperature
Mounting Temperature
(30 Seconds)
Storage Temperature
Value
8V
-5V TO 0V
4A
62 mA
24 dBm
27.7 W
200 °C
320 °C
-65 to 150 °C
Notes
2/
2/
2/
2/, 3/
4/, 5/
1/ These ratings represent the maximum operable values for this device.
2/ Combinations of supply voltage, supply current, input power, and output power shall not exceed PD.
3/ When operated at this bias condition with a base plate temperature of 70 °C, the
median life is 2.3E4 hours.
4/ Junction operating temperature will directly affect the device median time to failure (Tm). For
maximum life, it is recommended that junction temperatures be maintained at the lowest possible
levels.
5/ These ratings apply to each individual FET.
TABLE II
DC PROBE TEST
(TA = 25 °C, nominal)
NOTES
SYMBOL
1/
1/
1/, 2/
1/, 2/
1/, 2/
IDSS(Q35)
GM (Q35)
|VP(Q1, Q9, Q35)|
|VBVGS(Q35)|
|VBVGD(Q35)|
LIMITS
MIN
15
33
0.5
11
11
MAX
70.5
79.5
1.5
30
30
1/ Q35 is a 150 um Test FET
2/ VP, VBVGD, and VBVGS are negative.
UNITS
mA
mS
V
V
V
2
TriQuint Semiconductor: www. triquint.com (972)994-8465 Fax (972)994-8504 Info-mmw@tqs.com
May 2009 © Rev -

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