TB62707FG 데이터 시트보기 (PDF) - Toshiba

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TB62707FG

TOSHIBA Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC

Toshiba 

DC CHARACTERISTICS TEST CIRCUIT

AC CHARACTERISTICS TEST CIRCUIT

TB62707FG

PRECAUTIONS for USING

Utmost care is necessary in the design of the output line, VCC (VDD) and GND (L−GND, P−GND) line since IC

may be destroyed due to short−circuit between outputs, air contamination fault, or fault by improper grounding.

7

2006-06-14

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