HI1396(1997) 데이터 시트보기 (PDF) - Intersil
부품명
상세내역
일치하는 목록
HI1396 Datasheet PDF : 10 Pages
| |||
Test Circuits (Continued)
HI1396
1
42
2
41
-1V
3
40
A IIN
4
39
5
38
6
37
7
36
8
35
9
34
10
33
HI1396JCJ
11
32
12
31
13
30
14
29
15
28
16
27
17
26
18
25
19
24
20
23
-2V
21
22
IIN
-1V
A
-2V
60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44
61
43
62
42
63
41
64
40
65
39
66
38
67
37
68
36
1
HI1396AIL
35
2
34
3
33
4
32
5
31
6
30
7
29
8
28
9
27
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26
A IEE
A IEE
-5.2V
-5.2V
FIGURE 5A.
FIGURE 5B.
FIGURE 5. ANALOG INPUT BIAS AND POWER SUPPLY CURRENT TEST CIRCUITS
67.5MHz
OSC1
φ: VARIABLE
fR
AMP
VIN
CLK
OSC2
67.5MHz
ECL
BUFFER
HI1396
8
LOGIC
ANALYZER
1024
SAMPLES
VIN
CLK
∆υ
∆t
VIN
CLK
129
t
128
127
126
125
APERTURE JITTER
0V
-1V
-2V
σ (LSB)
Aperture jitter is defined as follows:
tAJ = σ ⁄ ∆-∆----υ-t = σ ⁄ 2----52---6-- × 2πf
Where σ (unit: LSB) is the deviation of the output codes when the
input frequency is exactly the same as the clock and is sampled at
the largest slew rate point.
FIGURE 6A.
FIGURE 6B. APERTURE JITTER TEST METHOD
FIGURE 6. SAMPLING DELAY AND APERTURE JITTER TEST CIRCUIT
4-1164
Share Link: 