NB2309A(2015) 데이터 시트보기 (PDF) - ON Semiconductor

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NB2309A
(Rev.:2015)

3.3 V Zero Delay Clock Buffer

ON Semiconductor 

NB2309A

Table 6. SWITCHING CHARACTERISTICS VCC = 3.0 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C (Note 6)

Parameter

Description

Test Conditions

Min Typ

1/t1

Output Frequency

30 pF load

15

10 pF load

15

1/t1

Duty Cycle = (t2 / t1) * 100 (−1, −1H) Measured at 1.4 V, FOUT = 66.67 MHz

40

50

(−1H)

< 50 MHz

45

50

t3

Output Rise Time

(−1)

Measured between 0.8 V and 2.0 V

(−1H)

t4

Output Fall Time

Measured between 2.0 V and 0.8 V

t5

Output−to−Output Skew

All outputs equally loaded

t6

Delay, REF Rising Edge to CLKOUT

Measured at VDD/2

0

Rising Edge

t7

Device−to−Device Skew

Measured at VDD/2 on the CLKOUT pins of

0

the device

t8

Output Slew Rate

Measured between 0.8 V and 2.0 V using

1

Test Circuit #2

tJ

Cycle−to−Cycle Jitter

Measured at 66.67 MHz, loaded outputs

tLOCK

PLL Lock Time

Stable power supply, valid clock presented

on REF pin

6. All parameters specified with loaded outputs in PLL−Mode.

Max

100

133

60

55

2.5

1.5

1.5

250

±350

Unit

MHz

%

ns

ns

ps

ps

700 ps

V/ns

200 ps

1.0 ms

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