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MC74HCT373

Octal 3−State Noninverting Transparent Latch with LSTTL−Compatible Inputs

ON Semiconductor 

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

MC74HCT373A

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kΩ

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 5.

*Includes all probe and jig capacitance

Figure 6.

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