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ICS81006I

VCXO-TO-LVCMOS OUTPUTS

Integrated Device Technology 

ICS81006I

VCXO-TO-6 LVCMOS OUTPUTS

PARAMETER MEASUREMENT INFORMATION

1.65V±5%

V,

DD

V

DDO

LVCMOS

GND

-1.65V±5%

SCOPE

Qx

3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT

2.4V±0.065V

0.9V±0.1V

VDD

VDDO

GND

LVCMOS

SCOPE

Qx

-0.9V±0.1V

3.3V CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT

1.6V±0.025V

0.9V±0.1V

VDD

VDDO

GND

LVCMOS

SCOPE

Qx

-0.9V±0.1V

2.5 CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT

2.05V±5%

1.25V±5%

VDD

VDDO

GND

LVCMOS

SCOPE

Qx

-1.25V±5%

3.3V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT

1.25V±5%

VDD,

VDDO

LVCMOS

GND

-1.25V±5%

SCOPE

Qx

2.5V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT

Phase Noise Plot

Phase Noise Mask

f1 Offset Frequency f2

RMS Jitter = Area Under the Masked Phase Noise Plot

RMS PHASE JITTER

IDT™ / ICS™ VCXO-TO-LVCMOS OUTPUTS

6

ICS81006AKI REV A OCTOBER 2, 2006

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