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HI1-0506-2(2005) 데이터 시트보기 (PDF) - Intersil

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HI1-0506-2 Datasheet PDF : 23 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
HI-506, HI-507, HI-508, HI-509
Electrical Specifications Supplies = +15V, -15V; VAH (Logic Level High) = 2.4V; VAL (Logic Level Low) = 0.8V,
Unless Otherwise Specified. For Test Conditions, Consult Test Circuits Section (Continued)
PARAMETER
TEST
TEMP
CONDITIONS (°C)
MIN
-2
TYP MAX
-4, -5, -9
MIN
TYP MAX
ANALOG CHANNEL CHARACTERISTICS
Analog Signal Range, VIN
On Resistance, rON
rON, (Any Two Channels)
Off Input Leakage Current, IS(OFF)
Note 3
Note 4
Full
-15
-
+15
-15
-
+15
25
-
180
300
-
180
400
25
-
5
-
-
5
-
25
-
0.03
-
-
0.03
-
Full
-
-
50
-
-
50
Off Output Leakage Current,
ID(OFF)
HI-506
Note 4
25
-
0.3
-
-
0.3
-
Full
-
-
300
-
-
300
HI-507
Full
-
-
200
-
-
200
HI-508
Full
-
-
200
-
-
200
HI-509
Full
-
-
100
-
-
100
On Channel Leakage Current, ID(ON)
HI-506
HI-507
HI-508
Note 4
25
-
0.3
-
-
0.3
-
Full
-
-
300
-
-
300
Full
-
-
200
-
-
200
Full
-
-
200
-
-
200
HI-509
Full
-
-
100
-
-
100
Differential Off Output Leakage Current, IDIFF
(HI-507, HI-509 Only)
Full
-
-
50
-
-
50
POWER SUPPLY CHARACTERISTICS
Current, I+
HI-506/HI-507
Note 7
Full
-
1.5
3.0
-
1.5
3.0
HI-508/HI-509
Note 7
Full
-
1.5
2.4
-
1.5
2.4
Current, I-
HI-506/HI-507
Note 7
Full
-
0.4
1.0
-
0.4
1.0
HI-508/HI-509
Note 7
Full
-
0.4
1.0
-
0.4
1.0
Power Dissipation, PD
HI-506/HI-507
Full
-
-
60
-
-
60
HI-508/HI-509
Full
-
-
51
-
-
51
NOTES:
3. VOUT = ±10V, IOUT = +1mA.
4. 10nA is the practical lower limit for high speed measurement in the production test environment.
5. Digital input leakage is primarily due to the clamp diodes (see Schematic). Typical leakage is less than 1nA at 25°C.
6. VEN = 0.8V, RL = 1K, CL = 15pF, VS = 7VRMS, f = 100kHz.
7. VEN, VA = 0V or 2.4V.
UNITS
V
%
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
mA
mA
mA
mA
mW
mW
Test Circuits and Waveforms TA = 25°C, VSUPPLY = ±15V, VAH = 2.4V, VAL = 0.8V, Unless Otherwise Specified
1mA
V2
IN
OUT
VIN
V2
rON = 1mA
FIGURE 1A. TEST CIRCUIT
8
FN3142.7
July 21, 2005

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