H25295 데이터 시트보기 (PDF) - Intersil
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H25295 Datasheet PDF : 8 Pages
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HA-2529
Test Circuits and Waveforms (Continued)
V+
1µF
INPUT
667.2Ω
2 7 0.001µF
-6
3+
4 1µF
1667Ω
V- 0.001µF
2kΩ
D
G
2N4416
S
5kΩ
SETTLING TIME
TEST POINT
2kΩ
CR1
CR2
OUTPUT
100pF
V+
20kΩ
IN
BAL
V-
OUT
COMP
CC
NOTES:
7. AV = -3.
8. Feedback and summing resistor ratios should be 0.1% matched.
9. Clipping diodes CR1 and CR2 are optional. HP5082-2810
recommended.
FIGURE 4. SETTLING TIME TEST CIRCUIT
NOTE: Tested offset adjustment range is |VOS + 1mV| minimum
referred to output. Typical ranges are +28mV to -18mV with
RT = 20kΩ
FIGURE 5. SUGGESTED VOS ADJUSTMENT AND
COMPENSATION HOOK UP
IN
IN
OUT
OUT
Horizontal Scale: 200ns/Div.
Vertical Scale: 2V/Div. Input, 5V/Div. Output
LARGE SIGNAL RESPONSE
Schematic Diagram
OFFSET-
PIN 1
BAL 1
Q30
Q29
200
R2AA
R21
440
R11
4
OFFSET+
BAL 2
200
R2BB
R10
440
1 8K
Horizontal Scale: 200ns/Div.
Vertical Scale: 50mV/Div. Input, 100mV/Div. Output
SMALL SIGNAL RESPONSE
COMP
V+
R12
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