datasheetbank_Logo
전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

CY7C1346H 데이터 시트보기 (PDF) - Cypress Semiconductor

부품명
상세내역
일치하는 목록
CY7C1346H
Cypress
Cypress Semiconductor Cypress
CY7C1346H Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
CY7C1346H
Switching Characteristics Over the Operating Range[11, 12]
-166
Parameter
tPOWER
Clock
Description
VDD(Typical) to the First Access[13]
Min.
1
Max.
Unit
ms
tCYC
tCH
tCL
Output Times
Clock Cycle Time
Clock HIGH
Clock LOW
6.0
ns
2.5
ns
2.5
ns
tCO
tDOH
tCLZ
tCHZ
tOEV
tOELZ
tOEHZ
Set-up Times
Data Output Valid after CLK Rise
Data Output Hold after CLK Rise
Clock to Low-Z[14, 15, 16]
Clock to High-Z[14, 15, 16]
OE LOW to Output Valid
OE LOW to Output Low-Z[14, 15, 16]
OE HIGH to Output High-Z[14, 15, 16]
3.5
ns
1.5
ns
0
ns
3.5
ns
3.5
ns
0
ns
3.5
ns
tAS
Address Set-up before CLK Rise
1.5
ns
tADS
ADSC, ADSP Set-up before CLK Rise
1.5
ns
tADVS
ADV Set-up before CLK Rise
1.5
ns
tWES
GW, BWE, BW[A:D] Set-up before CLK Rise
1.5
ns
tDS
Data Input Set-up before CLK Rise
1.5
ns
tCES
Chip Enable Set-Up before CLK Rise
1.5
ns
Hold Times
tAH
Address Hold after CLK Rise
0.5
ns
tADH
ADSP, ADSC Hold after CLK Rise
0.5
ns
tADVH
ADV Hold after CLK Rise
0.5
ns
tWEH
GW, BWE, BW[A:D] Hold after CLK Rise
0.5
ns
tDH
Data Input Hold after CLK Rise
0.5
ns
tCEH
Chip Enable Hold after CLK Rise
0.5
ns
Notes:
11. Timing reference level is 1.5V when VDDQ = 3.3V and 1.25V when VDDQ = 2.5V.
12. Test conditions shown in (a) of AC Test Loads unless otherwise noted.
13. This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially before a Read or Write operation
can be initiated.
14. tCHZ, tCLZ, tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
15. At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions.
16. This parameter is sampled and not 100% tested.
Document #: 38-05672 Rev. *B
Page 10 of 16
[+] Feedback

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]