AS7C33128PFD32A 데이터 시트보기 (PDF) - Alliance Semiconductor
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AS7C33128PFD32A Datasheet PDF : 11 Pages
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AS7C33128PFD32A
AS7C33128PFD36A
®
AC test conditions
• Output load: see Figure B, except for tLZC, tLZOE, tHZOE, tHZC, see Figure C.
• Input pulse level: GND to 3V. See Figure A.
• Input rise and fall time (measured at 0.3V and 2.7V): 2 ns. See Figure A.
• Input and output timing reference levels: 1.5V.
+3.0V
90%
10%
GND
90%
10%
Figure A: Input waveform
DOUT
Z0 = 50Ω
50Ω
VL = 1.5V
for 3.3V I/O;
30 pF* = VDDQ/2
for 2.5V I/O
Figure B: Output load (A)
Thevenin equivalent:
DOUT
351Ω
+3.3V for 3.3V I/O;
+2.5V for 2.5V I/O
317Ω
5 pF*
GND *including scope
and jig capacitance
Figure C: Output load(B)
Notes
1 For test conditions, see AC Test Conditions, Figures A, B, C.
2 This parameter measured with output load condition in Figure C.
3 This parameter is sampled, but not 100% tested.
4 tHZOE is less than tLZOE; and tHZC is less than tLZC at any given temperature and voltage.
5 tCH measured as HIGH above VIH and tCL measured as LOW below VIL.
6 This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK. All other synchronous inputs must
meet the setup and hold times for all rising edges of CLK when chip is enabled.
7 Write refers to GWE, BWE, BW[a:d].
8 Chip select refers to CE0, CE1, CE2.
Package Dimensions
100-pin quad flat pack (TQFP)
TQFP
Min
Max
A1
0.05
0.15
A2
1.35
1.45
b
0.22
0.38
c
0.09
0.20
D
13.90
14.10
E
19.90
20.10
e
0.65 nominal
Hd
15.90
16.10
He
21.90
22.10
L
0.45
0.75
L1
1.00 nominal
α
0°
7°
Dimensions in millimeters
Hd
D
b
e
He E
c
L1
A1 A2
α
L
3/22/01; v.1.0
Alliance Semiconductor
P. 10 of 11
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