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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

AD9444 데이터 시트보기 (PDF) - Analog Devices

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AD9444
ADI
Analog Devices ADI
AD9444 Datasheet PDF : 40 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
VIN
CLK–
CLK+
DX
DCO+
DCO–
N
N–1
tCLKL
tCLKH
tPD
N+1
N+2
12 CYCLES
N-12
N-11
N-1
N
tDCOPD
Figure 3. CMOS Timing Diagram
AD9444
EXPLANATION OF TEST LEVELS
Test Level
I
II
III
IV
V
VI
Definitions
100% production tested.
100% production tested at 25°C and sample tested at specified temperatures.
Sample tested only.
Parameter is guaranteed by design and characterization testing.
Parameter is a typical value only.
100% production tested at 25°C and guaranteed by design and characterization for industrial temperature range.
Rev. 0 | Page 7 of 40

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