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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

AD1987 데이터 시트보기 (PDF) - Analog Devices

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AD1987 Datasheet PDF : 20 Pages
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AD1987
ABSOLUTE MAXIMUM RATINGS
ENVIRONMENTAL CONDITIONS
Stresses greater than those listed below may cause permanent
Ambient Temperature Rating
damage to the device. This is a stress rating only; functional
operation of the device at these or any other conditions above
those indicated in the operational section of this specification is
not implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
TAMB = TCASE – (PD × θCA)
TCASE = Case Temperature in °C
PD = Power Dissipation in W
θCA = Thermal Resistance (Case-to-Ambient)
θJA = Thermal Resistance (Junction-to-Ambient)
θJC = Thermal Resistance (Junction-to-Case)
Power Supplies
Rating
All measurements per EIA-JESD51 with 2S2P test board per
Digital (DVDD)
–0.30 V to +3.65 V
EIA-JESD51-7.
Digital I/O (DVIO)
–0.30 V to +3.65 V
Analog (AVDD)
Input Current (except supply pins)
Analog Input Voltage (Signal Pins)
Digital Input Voltage (Signal Pins)
Ambient Temperature (Operating)
Storage Temperature
–0.30 V to +3.65 V
±10.0 mA
–0.30 V to AVDD +0.3 V
–0.30 V to DVIO +0.3 V
0°C to +70°C
–65°C to +150°C
E ESD SENSITIVITY
Table 4. Thermal Resistance
Package
LFCSP_VQ
θJA
θJC
θCA
97
15
32
T ESD (electrostatic discharge) sensitive device.
Charged devices and circuit boards can discharge
without detection. Although this product features
E patented or proprietary protection circuitry, damage
may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to
OBSOL avoid performance degradation or loss of functionality.
Unit
°C/W
Rev. A | Page 8 of 20 | March 2008

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