M52334FP 데이터 시트보기 (PDF) - Renesas Electronics

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M52334FP

PLL-Split VIF/SIF IC

Renesas Electronics 

M52334FP

Electrical Characteristics Test Method

Video S/N

Input SG2 into VIF IN and measure the video out (Pin 3) noise in r.m.s at TP3-B through a 5 MHz (−3 dB) L.P.F.

S/N = 20 log

0.7 • Vo det

NOISE

(dB)

BW Video Band Width

1. Measure the 1 MHz component level of EQ output TP3A with a spectrum analyzer when SG3 (f2 = 44.75 MHz) is

input into VIF IN. At that time, measure the voltage at TP13 with SW13, set to position 2, and then fix V13 at that

voltage.

2. Reduce f2 and measure the value of (f2 − f0) when the (f2 − f0) component level reaches –3 dB from the 1 MHz

component level as shown below.

TP18

–3 dB

1 MHz

(f2 – f0)

BW

VIN MIN Input Sensitivity

Input SG4 (Vi = 90 dBµ) into VIF IN, and then gradually reduce Vi and measure the input level when the 20 kHz

component of EQ output TP3A reaches −3 dB from Vo det level.

VIN MAX Maximum Allowable Input

1. Input SG5 (Vi = 90 dBµ) into VIF IN, and measure the level of the 20 kHz components of EQ output.

2. Gradually increase the Vi of SG and measure the input level when the output reaches −3 dB.

GR AGC Control Range

GR = VIN MAX − VIN MIN (dB)

Rev.2.00 Jun 14, 2006 page 5 of 18

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