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FDB2532 데이터 시트보기 (PDF) - Fairchild Semiconductor

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FDB2532
Fairchild
Fairchild Semiconductor Fairchild
FDB2532 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
June 2002
FDB2532 / FDP2532 / FDI2532
N-Channel PowerTrench® MOSFET
150V, 79A, 16m
Features
• rDS(ON) = 14m(Typ.), VGS = 10V, ID = 33A
• Qg(tot) = 86nC (Typ.), VGS = 10V
• Low Miller Charge
• Low QRR Body Diode
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
Formerly developmental type 82884
Applications
• DC/DC converters and Off-Line UPS
• Distributed Power Architectures and VRMs
• Primary Switch for 24V and 48V Systems
• High Voltage Synchronous Rectifier
• Direct Injection / Diesel Injection System
• 42V Automotive Load Control
• Electronic Valve Train System
DRAIN
(FLANGE)
SOURCE
GATE
DRAIN
DRAIN
(FLANGE)
SOURCE
DRAIN
GATE
GATE
TO-220AB
FDP SERIES
SOURCE
TO-263AB
FDB SERIES
G
DRAIN
(FLANGE)
TO-262AB
FDI SERIES
MOSFET Maximum Ratings TC = 25°C unless otherwise noted
Symbol
Parameter
VDSS
VGS
ID
Drain to Source Voltage
Gate to Source Voltage
Drain Current
Continuous (TC = 25oC, VGS = 10V)
Continuous (TC = 100oC, VGS = 10V)
Continuous (Tamb = 25oC, VGS = 10V, RθJA = 43oC/W)
Pulsed
EAS
Single Pulse Avalanche Energy (Note 1)
Power dissipation
PD
Derate above 25oC
TJ, TSTG Operating and Storage Temperature
Thermal Characteristics
RθJC
RθJA
RθJA
Thermal Resistance Junction to Case TO-220, TO-263, TO-262
Thermal Resistance Junction to Ambient TO-220, TO-262 (Note 2)
Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area
Ratings
150
±20
79
56
8
Figure 4
400
310
2.07
-55 to 175
0.48
62
43
D
S
Units
V
V
A
A
A
A
mJ
W
W/oC
oC
oC/W
oC/W
oC/W
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
certification.
©2002 Fairchild Semiconductor Corporation
FDB2532 / FDP2532 / FDI2532 Rev. A1

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