AS8S128K32P-15/883C 데이터 시트보기 (PDF) - Austin Semiconductor
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AS8S128K32P-15/883C Datasheet PDF : 12 Pages
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Austin Semiconductor, Inc.
SRAM
AS8S128K32
ABSOLUTE MAXIMUM RATINGS*
Voltage of Vcc Supply Relative to Vss.....................-1V to +7V
Storage Temperature..........................................-65°C to +150°C
Short Circuit Output Current(per I/O)...............................20mA
Voltage on Any Pin Relative to Vss..................-.5V to Vcc+1V
Maximum Junction Temperature**.................................+175°C
*Stresses greater than those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation on the
device at these or any other conditions above those indicated
in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
**Junction temperature depends upon package type, cycle time,
loading, ambient temperature and airflow. See the Application
Information section at the end of this datasheet for more infor-
mation.
ELECTRICAL CHARACTERISTICS AND RECOMMENDED DC OPERATING CONDITIONS
(-55°C<TA<125°C; Vcc = 5v ±10%)
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PARAMETER
Power Supply Current:
Operating
CONDITIONS
CE\<VIL; VCC=MAX
f = MAX = 1/tRC (MIN)
Outputs Open
CE\>VIH; VCC=MAX
f = MAX = 1/tRC (MIN)
Outputs Open
Power Supply Current:
Standby
CE\ = OE\ = VIH;
CMOS Compatible; VCC = MAX
f = 5 MHz
CE\ > Vcc -0.2V; Vcc = MAX
VIL < Vss +0.2V;
VIH > VCC -0.2V; f = 0 Hz
CE\ > Vcc -0.2V; Vcc = MAX
VIL < Vss +0.2V;
VIH > Vcc -0.2V; f = 0 Hz
"L" Version Only
SYM -15
Icc 700
ISBT1 280
ISBT2 100
ISBC1 40
ISBC2 24
MAX
-17 -20 -25 -35 -45 UNITS NOTES
650 600 560 520 500 mA 3, 13 (1)
220 200 180 160 150 mA (1)
80 80 60 60 60 mA (1)
40 40 40 40 40 mA (2)
24 24 24 24 24 mA (2)
NOTE: 1) Address switching sequence A, A+1, A+2, etc.
2) 1/2 input at HIGH, 1/2 input at LOW.
AS8S128K32
Rev. 4.0 5/03
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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