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DG406 데이터 시트보기 (PDF) - Intersil

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DG406 Datasheet PDF : 13 Pages
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DG406, DG407
Test Circuits and Waveforms (Continued)
LOGIC 3V
INPUT 0V
VS1B
SWITCH
OUTPUT 0V
VO
VS8B
S1 ON
tTRANS
50%
50%
80% VS8
S8 ON
tr < 20ns
tf < 20ns
80% VS1
tTRANS
FIGURE 1C. MEASUREMENT POINTS
FIGURE 1. TRANSITION TIME
+15V
LOGIC
INPUT VIN
50
A3
V+
S1
-5V
A2
S2 - S16
A1 DG406
A0
EN GND V- D
300
-15V
VO
35pF
FIGURE 2A. DG406 TEST CIRCUIT
+15V
LOGIC
INPUT VIN
50
A2
V+ S1B
-5V
A1 DG407
A0
EN DA AND DB
GND V-
300
VO
35pF
-15V
= S1A - S8A, S2B - S8B, DA
FIGURE 2B. DG407 TEST CIRCUIT
LOGIC
INPUT
VIN
SWITCH
OUTPUT
VO
3V
0V
tON(EN)
0V
50%
50%
90% VO
VO
tr < 20ns
tf < 20ns
tOFF(EN)
FIGURE 2C. MEASUREMENT POINTS
FIGURE 2. ENABLE SWITCHING TIMES
+15V
+2.4V
LOGIC
INPUT
50
EN V+ ALL S
A3
AND DA
A2 DG406
A1 DG407 D,
A0 GND V- DB
+5V (VS)
300
VO
35pF
-15V
3V
LOGIC
INPUT
0V
VS
SWITCH
OUTPUT
VO
0V
tr < 20ns
tf < 20ns
80%
tOPEN
FIGURE 3A. TEST CIRCUIT
FIGURE 3B. MEASUREMENT POINTS
FIGURE 3. BREAK-BEFORE-MAKE INTERVAL
7
FN3116.9
March 13, 2006

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