HI-539
Test Circuits and Waveforms Unless Otherwise Specified TA = 25oC, V+ = +15V, V- = -15V, VAH = 4V and VAL = 0.8V (Continued)
10
ID(ON)
1
HI-539†
EN
0.8V
OUT A
A ID(OFF)
ID(OFF) = IS(OFF)
25
50
75
100
125
TEMPERATURE (oC)
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE
HI-539†
±10V
10V
A0
A1
† Similar Connection For Side “B”
FIGURE 2B. ID(OFF) TEST CIRCUIT (NOTE 6)
HI-539†
A IS(OFF)
OUT A
0.8V
EN
±10V
10V
A0
A1
† Similar Connection For Side “B”
OUT A
A0
A1 EN
10V
A ID(ON)
±10V
4V
†Similar Connection For Side “B”
FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 6)
FIGURE 2D. ID(ON) TEST CIRCUIT (NOTE 6)
NOTE:
6. Three measurements = ±10V, 10V, and 0V.
FIGURE 2. LEAKAGE CURRENT
14
12
10
8
6
4
2
0
100Hz
FUNCTIONAL LIMIT
VSUPPLY = ±15V
VSUPPLY = ±10V
1kHz
10kHz
100kHz
TOGGLE FREQUENCY
1MHz 3MHz 10MHz
+15V/+10V
A +ISUPPLY
VA
50Ω
V+
A1
IN
HI-539 †
1A
A0
IN 2A
IN 3A
+10V/+5V
IN 4A
-10V/-5V
5V
EN
OUT A
GND V-
HIGH = 4.0V
VA
LOW = 0V
50% DUTY CYCLE
10MΩ
A -ISUPPLY
14pF
-15V/-10V
†Similar Connection For Side “B”
FIGURE 3A. SUPPLY CURRENT vs TOGGLE FREQUENCY
FIGURE 3B. TEST CIRCUIT
FIGURE 3. DYNAMIC SUPPLY CURRENT
5