GRM219R60J475ME32 데이터 시트보기 (PDF) - Murata Manufacturing
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GRM219R60J475ME32 Datasheet PDF : 30 Pages
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No.
Item
15 High
Appearance
Temperature
High Humidity Capacitance
(Steady)
Change
Q or D.F.
Specification
No defects or abnormalities.
Within +/-12.5%
DF:0.2 max.
I.R.
More than 500MΩ or 12.5Ω･F (Whichever is smaller)
16 Durability
Appearance No defects or abnormalities.
Capacitance Within +/-12.5%
Change
Q or D.F. DF:0.2 max.
I.R.
More than 1000MΩ or 25Ω･F (Whichever is smaller)
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
40+/-2℃
Test Humidity :
90%RH to 95%RH
Test Time :
500+/-12h
Test Voltage :
Rated Voltage
Charge/Discharge Current : 50mA max.
Pre-treatment :
Post-treatment :
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Maximum Operating Temperature+/-3℃
Test Time :
1000+/-12h
Test Voltage :
150% of the rated voltage
Charge/Discharge Current : 50mA max.
Pre-treatment :
Post-treatment :
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
GRM219R60J475ME32-01A
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