RHF310AK01V 데이터 시트보기 (PDF) - STMicroelectronics

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RHF310AK01V

Rad-hard 400 µA high-speed operational amplifier

STMicroelectronics 

RHF310A

Radiations

5

Radiations

5.1

Introduction

Table 6 summarizes the radiation performance of the RHF310A.

Type

TID

Heavy ions

Table 5. Radiations

Features

High-dose rate

Low-dose rate

ELDRS

SEL immunity (at 125 °C) up to:

Inverting

SET characterized

Non-inverting

Subtracting

Value

300

300

300

110

No SET

LETth = 18

σ = 1.00E-06

LETth = 7

σ = 2.00E-05

Unit

krad

MeV.cm²/mg

MeV.cm²/mg

cm²/device

MeV.cm²/mg

cm²/device

5.2

Total ionizing dose (TID)

The products guaranteed in radiation within the RHA QML-V system fully comply with the MIL-STD-883 test

method 1019 specification.

The RHF310A is RHA QML-V qualified, and is tested and characterized in full compliance with the MIL-STD-883

specification. It uses a mixed bipolar and CMOS technology and is tested both below 10 mrad/s (low dose rate)

and between 50 and 300 rad/s (high dose rate).

• The ELDRS characterization is performed in qualification only on both biased and unbiased parts, on a

sample of ten units from two different wafer lots.

• Each wafer lot is tested at high-dose rate only, in the worst bias case condition, based on the results

obtained during the initial qualification.

5.3

Heavy ions

Note:

The heavy ion trials are performed on qualification lots only. No additional test is performed.

DS6201 - Rev 7

page 10/25

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