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MC74HC367ADG

Hex 3-State Noninverting Buffer with Separate 2-Bit and 4-Bit Sections

ON Semiconductor 

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

*Includes all probe and jig capacitance

Figure 4.

MC74HC367A

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kW

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 5.

TO OTHER

BUFFERS

ONE OF 6

BUFFERS

VCC

Y

A

OUTPUT ENABLE

Figure 6. Logic Detail

ORDERING INFORMATION

Device

Package

Shipping†

MC74HC367ADG

SOIC−16

(Pb−Free)

48 Units / Rail

MC74HC367ADR2G

SOIC−16

(Pb−Free)

2500 Tape & Reel

MC74HC367ADTG

TSSOP−16

(Pb−Free)

96 Units / Tube

MC74HC367ADTR2G

TSSOP−16

(Pb−Free)

2500 Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging

Specifications Brochure, BRD8011/D.

http://onsemi.com

5

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