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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

ISL55100A 데이터 시트보기 (PDF) - Renesas Electronics

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ISL55100A Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ISL55100A
Absolute Maximum Ratings
VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 19V
VEXT to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
Input Voltages
DATA, DRV EN, CVX, VH, VL, VINP, COMPX, LOWSWING
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . (VEE - 0.5V) to (VCC + 0.5V)
Output Voltages
DOUT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . (VEE - 0.5V) to (VH + 0.5V)
QX . . . . . . . . . . . . . . . . . . . . . (COMP LOW - 0.5V) to (COMP HIGH + 0.5V)
Thermal Information
Thermal Resistance (Typical, Notes 4, 5) JA (°C/W) JC (°C/W)
72 Ld QFN Package . . . . . . . . . . . . . . . . . . . 23
2.0
Maximum Junction Temperature (Plastic Package) . . . . . . . . . . . +150°C
Maximum Storage Temperature Range . . . . . . . . . . . . . -65°C to +150°C
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTES:
4. JA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See Tech
Brief TB379.
5. For JC, the “case temp” location is the center of the exposed metal pad on the package underside.
6. Device temperature is closely tied to data-rates, driver loads and overall pin activity. Review “Power Dissipation Considerations” on page 9 for more
information.
Recommended Operating Conditions
PARAMETER
SYMBOL
MIN
MAX
(Note 13)
TYP
(Note 13)
UNITS
Device Power-(VEXT = VEE) VEXT Not Used
VCC - VEE
12 (Note 10)
15
18
V
Device Power-(VEXT = VEE + 5.5V)
VCC - VEE
9 (Note 10)
15
18
V
VEXT Optional External Logic Power
VEXT - VEE
5.5 (Note 10)
5.75
6.0
V
Driver Output High Rail
VH
VEE + 1
-
VCC - 0.5
V
Driver Output Low Rail
VL
VEE + 0.5
-
VEE + 6
V
Comparator Output High Rail
COMP-High
VEE + 1
-
VCC - 0.5
V
Comparator Output Low Rail
COMP-Low
VEE + 0.5
-
VEE + 6
V
Ambient Temperature
TA
-40
-
+85
°C
Junction Temperature
TJ
-
-
+150
°C
Electrical Specifications
PARAMETER
Test Conditions: VCC = 12V, VEE = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp-Low = 0V, V5V = VEE and
LOWSWING = VCC.
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
DRIVER DC CHARACTERISTICS
ISL55100A Output Resistance
ROUTD IO = ±200mA, data not toggling
3
4.5
7.0
Ω
ISL55100A DC Output Current
IOUTD Per Individual driver
±200
-
-
mA
ISL55100A AC Output Current (Note 6)
IOUTDAC Per Individual driver
-
1.0
-
A
ISL55100A Minimum Output Swing
VOMIN VH = 200mV, VL = 0V
185
-
-
mV
Disabled HIZ Leakage Current
HIZ
VOUT = VCC with VH = VL + VEE or VOUT = VEE
-1
0
1
µA
with VH = VL = VCC
DRIVER TIMING CHARACTERISTICS
Datato DOUT Propagation Delay
tPD Lowswing Disabled (Note 9)
8
12
16
ns
Lowswing Enabled (Note 9)
9
13
17
ns
Driver Timing Skew, All Edges (Note 7)
-
<1
-
ns
Disable (HIZ) Time
tDIS DVRENTransition from Enable to Disable
16
18
26
ns
FN7486 Rev 3.00
December 4, 2014
Page 4 of 14

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