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83940DKILF 데이터 시트보기 (PDF) - Integrated Device Technology

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83940DKILF
IDT
Integrated Device Technology IDT
83940DKILF Datasheet PDF : 19 Pages
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ICS83940DI Data Sheet
LOW SKEW, 1-TO-18 LVPECL-TO-LVCMOS/LVTTL FANOUT BUFFER
Table 5B. AC Characteristics, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
fMAX
Output Frequency
Propagation
PCLK, nPCLK; NOTE 1, 5
ƒ 150MHz
1.7
Delay
LVCMOS_CLK; NOTE 2, 5
ƒ 150MHz
1.7
tPLH
Propagation
PCLK, nPCLK; NOTE 1, 5
ƒ > 150MHz
1.6
Delay
LVCMOS_CLK; NOTE 2, 5
ƒ > 150MHz
1.8
tsk(o)
Output Skew;
NOTE 3, 5
PCLK, nPCLK
LVCMOS_CLK
Measured on the Rising Edge
@ VDDO/2
Part-to-Part Skew; PCLK, nPCLK
NOTE 6
LVCMOS_CLK
ƒ 150MHz
ƒ 150MHz
tsk(pp)
Part-to-Part Skew; PCLK, nPCLK
NOTE 6
LVCMOS_CLK
ƒ > 150MHz
ƒ > 150MHz
Part-to-Part Skew; PCLK, nPCLK
NOTE 4, 5
LVCMOS_CLK
Measured on the Rising Edge
@ VDDO/2
tR / tF
odc
Output Rise/Fall Time
Output Duty Cycle
0.5V to 1.8V
0.3
ƒ < 134MHz
45
Typical
50
Maximum
250
3.2
3.0
3.4
3.3
150
150
1.5
1.3
1.8
1.5
850
750
1.2
55
Units
MHz
ns
ns
ns
ns
ps
ps
ns
ns
ns
ns
ps
ps
ns
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output VDDO/2.
NOTE 2: Measured from VDD/2 to VDDO/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at VDDO/2.
ICS83940DYI REVISION C May 19, 2016
7
©2016 Integrated Device Technology, Inc.

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