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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

CBT3245A(2019) 데이터 시트보기 (PDF) - NXP Semiconductors.

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CBT3245A
(Rev.:2019)
NXP
NXP Semiconductors. NXP
CBT3245A Datasheet PDF : 13 Pages
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Nexperia
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VI
G
VCC
VO
DUT
RT
VM
tr
tf
VM
VEXT
RL
CL
RL
CBT3245A
Octal bus switch
Fig. 6.
001aae331
Test data is given in Table 9.
All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz; Zo = 50 Ω.
The outputs are measured one at a time with one transition per measurement.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Test circuit for measuring switching times
Table 9. Test data
Supply voltage
VCC = 5.0 V ± 0.5 V
Input
VI
GND to 3.0 V
tr, tf
≤ 2.5 ns
Load
CL
50 pF
RL
500 Ω
VEXT
tPLH, tPHL
open
tPLZ, tPZL
7.0 V
tPHZ, tPZH
open
CBT3245A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 30 April 2019
© Nexperia B.V. 2019. All rights reserved
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