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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

74VHC157 데이터 시트보기 (PDF) - STMicroelectronics

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74VHC157
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74VHC157 Datasheet PDF : 12 Pages
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74VHC157
Table 8: Capacitive Characteristics
Test Condition
Value
Symbol
Parameter
TA = 25°C
-40 to 85°C -55 to 125°C Unit
CIN Input Capacitance
CPD Power Dissipation
Capacitance
(note 1)
Min. Typ. Max. Min. Max. Min. Max.
6 10
10
10 pF
18
pF
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per
channel)
Table 9: Dynamic Switching Characteristics
Test Condition
Value
Symbol
Parameter
VCC
(V)
VOLP Dynamic Low
Voltage Quiet
5.0
VOLV Output (note 1, 2)
Dynamic High
VIHD Voltage Input
5.0
(note 1, 3)
Dynamic Low
VILD Voltage Input
5.0
(note 1, 3)
CL = 50 pF
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
0.3 0.8
V
-0.8 -0.3
3.5
V
1.5
V
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (VILD), 0V to threshold
(VIHD), f=1MHz.
Figure 4: Test Circuit
CL =15/50pF or equivalent (includes jig and probe capacitance)
RT = ZOUT of pulse generator (typically 50)
5/12

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