CX3225GB16000P0HPQCC 데이터 시트보기 (PDF) - Unspecified

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CX3225GB16000P0HPQCC

Quartz Crystal

Unspecified 

Drawing No.

K1101-13754-432 9/11

8.Enviromental requirements

After following test, frequency shall not change more than ±20×10－６

And CI，±20% or 5Ωof large value.

8.1 Resistance to Shock

Test condition

Natural dropped from height 100cm onto hard wood

board in 3 times

8.2 Resistance to Vibration

Test condition

frequency

Amplitude

Cycle time

Direction

： 10－55 －10 Hz

： 1.5mm

： 15 minutes

： X,Y,Z (3direction),2 h each.

8.3 Resistance to Heat

Test condition

The quartz crystal unit shall be stored at a

temperature of +85±2°C for 500 h.

Then it shal be subjected to standard atmospheric

conditions for 1 h ,after whichi measurement shall

be made.

8.4 Resistance to Cold

Test condition

The quartz crystal unit shall be stored at a

temperature of -40±2°C for 500 h.

Then it shal be subjected to standard atmospheric

conditions for 1 h ,after whichi measurement shall

be made.

8.5 Thermal Shock

Test condition

The quartz crystal unit shall be subjected to 500

succesive change of temperature cycles ，each as

shown in table below，Then it shall be subjected

to standard atmospheric conditions for 1h，after

which measurements shall be made.

Cycle

：-40±2°C（30min.）to 25±2°C（5min.）

to +85±2°C（30min.）to 25±2°C（5min.）

KYOCERA Crystal Device Corporation

KBS-5079E

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