74HC125 데이터 시트보기 (PDF) - Diodes Incorporated.

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74HC125

QUADRUPLE 3-STATE BUFFERS OE LOW

Diodes Incorporated. 

Parameter Measurement Information

74HC125

TEST

tPLZ (see Notes D and E)

tPZL(see Notes D and F)

Condition

Vload

Vload

VCC

2.0V to 6.0V

Inputs

VI

tr/tf

VCC

≤3ns

VM

VCC/2

VLOAD

2 X VCC

CL

15,50 pF

RL

2 KΩ

V∆

10% of VCC

Voltage Waveform

Pulse Duration

Voltage Waveform

Propagation Delay Times

Figure 1 Load Circuit and Voltage Waveforms

Notes:

A. Includes test lead and test apparatus capacitance.

B. All pulses are supplied at pulse repetition rate ≤ 1 MHz.

C. The inputs are measured one at a time with one transition per measurement.

D. For the 3 state device tPLZ and tPZL are the same as tPD.

E. tPZL is measured at VM.

D. tPLZ is measured at VOL +V∆.

74HC125

Document number: DS35326 Rev. 3 - 2

5 of 9

www.diodes.com

January 2013

© Diodes Incorporated

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