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MC100E156 데이터 시트보기 (PDF) - ON Semiconductor

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MC100E156
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC100E156 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MC10E156, MC100E156
Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = 5.0 V (Note 9)
0°C
25°C
85°C
Symbol
fMAX
tPLH
tPHL
Characteristic
Maximum Toggle Frequency
Propagation Delay to Output
Min Typ Max Min Typ Max Min Typ Max Unit
700 1100
700 1100
700 1100
MHz
D 400
SEL0 550
SEL1 450
LEN 350
MR 350
600 900 400
775 1050 550
650 900 450
500 800 350
600 825 350
600 900 400
775 1050 550
650 900 450
500 800 350
600 825 350
ps
600 900
775 1050
650 900
500 800
600 825
ts
Setup Time
ps
D 400 275
400 275
400 275
SEL0 700 300
700 300
700 300
SEL1 600 400
600 400
600 400
th
Hold Time
ps
D 300 275
300 275
300 275
SEL0 100 300
100 300
100 300
SEL1 200 400
200 400
200 400
tRR
Reset Recovery Time
tPW
Minimum Pulse Width
800 600
800 600
800 600
ps
ps
MR 400
400
400
tSKEW
tJITTER
tr
tf
Within-Device Skew (Note 10)
Random Clock Jitter (RMS)
Rise/Fall Time
(20 - 80%)
50
50
50
ps
<1
<1
<1
ps
ps
275 475 700 275 475 700 275 475 700
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary 0.46 V / +0.06 V.
100 Series: VEE can vary 0.46 V / +0.8 V.
10. Within-device skew is defined as identical transitions on similar paths through a device.
Q
Driver
Device
Q
Zo = 50 W
Zo = 50 W
50 W
50 W
D
Receiver
Device
D
VTT
VTT = VCC 2.0 V
Figure 3. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D Termination of ECL Logic Devices.)
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