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M54HC194DT

Rad-hard high speed 2 to 6 V CMOS logic series

STMicroelectronics 

Radiation data

4

Radiation data

M54HCxxx, M54HCTxxx

Each wafer lot is qualified at 50 krad (Si) total dose as per ESCC 22900 specification at 210

rad/hour.

The HC/HCT series is characterized under heavy Ion on 4 functions representative of the

whole series and qualified as per the results of this characterization.

Detailed results are provided in Table 6:

Function

Gate: 54HC08

Multiplexer 54HC157

Flip-flop 54HC273

Counter 54HC4040

Analog mux/demux 54HC4053

Table 6. Radiation data

Result

SEL and SEU free for LET [ 111 MeV/mg/cm²

SEL and SEU free for LET[ 111 MeV/mg/cm²

SEL free for LET [ 111 MeV/mg/cm²

SEU: LETth = 16 MeV/mg/cm², σsat = 1.7 x 10-4 cm²

SEL free for LET [ 111 MeV/mg/cm²

SEU: LETth = 34 MeV/mg/cm², σsat = 4.2 x 10-4 cm²

SEL free for LET [ 111 MeV/mg/cm²

SEU: LETth = 7 MeV/mg/cm², σsat = 2.4 x 10-4 cm²

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