AP-ISD256IS2B-T 데이터 시트보기 (PDF) - Unspecified

부품명

상세내역

일치하는 목록

AP-ISD256IS2B-T

Industrial Secure Digital Card

Unspecified 

Industrial Secure Digital Card

AP-ISDxxxXXXX-1X

1.2.1 Flash Management

The SD controller contains logic/physical flash block mapping and bad block management system. It will

manage all flash block include user data space and spare block.

The embedded SD also contains a sophisticated defect and error management system. It does a read

after write under margin conditions to verify that the data is written correctly (except in the case of write

pre-erased sectors). In case that a bit is found to be defective, the embedded SD replaces this bad bit

with a spare bit within the sector header. If necessary, the embedded SD will even replace the entire

sector with a spare sector. This is completely transparent to the master (host device) and does not

consume any user data space.

1.2.2 Powerful ECC Algorithms

The powerful ECC algorithms will enhance flash block use rate and whole device life. The SD controller

has an innovative algorithm to recover the data. Built-in BCH-ECC supports correction up to 24 bits data

error per 1K bytes data automatically

1.2.3 Power Management

A power saving feature of the embedded SD is automatic entrance and exit from sleep mode. Upon

completion of an operation, the embedded SD will enter the sleep mode to conserve power if no further

commands are received within X seconds, where X is programmable by software. The master does not

have to take any action for this to occur. The embedded SD is in sleep mode except when the host is

accessing it, thus conserving power.

Any command issued by the master to the embedded SD will cause it to exit sleep mode and response to

the master.

1.2.4 S.M.A.R.T

S.M.A.R.T. (SMART), an acronym stands for Self-Monitoring, Analysis and Reporting Technology, is an

open standard allowing an individual disk drive in the ATA/IDE or SCSI interface to automatically monitor

its own health and report potential problems in order to prevent data loss. This failure warning technology

provides predictions from unscheduled downtime by observing and storing critical drive performance and

calibration parameters. Ideally, this should allow taking hands-on actions to keep from impending drive

failure.

Failures are divided into two categories: those that can be predicted and those that cannot. Predictable

failures occur gradually over time, and the decline in performance can be detected; on the other hand,

unpredictable failures happen very sudden without any warning. These failures may be caused by power

surges or related to electronic components. The purpose of the SMART implementation is to predict near-

term failures of each individual disk drive and generate a warning to prevent unfortunate loss.

4

© 2011 Apacer Technology, Inc.

Rev. 1.0

Share Link: